Sprint FLS4510 Flying Probe Tester
- 產(chǎn)品名稱：Sprint FLS4510 Flying Probe Tester
- 產(chǎn)品型號：Sprint FLS4510
- 產(chǎn)品廠商：acculogic
- 產(chǎn)品文檔：
Sprint FLS4510 Flying Probe Tester
的詳細介紹
More Power, More Functionality Behind Every Probe.
§ Advanced, proven architecture based on 3-phase linear platen motors with air bearings for high speed, accurate, reliable and wear-free operation
§ 4 identical flying probes with 6° probing angle
§ Quick and easy test program generation from CAD or Gerber data
§ Precision analog test
§ Power-off Open Pin Detection on ICs, connectors, and other devices
§ Board power on test
§ Boundary scan (JTAG) test
§ Mixed signal function test using external instruments
§ On-board device programming
§ Automated Optical Inspection (AOI)
§ Advanced fault coverage report generator
§ Statistical Process Control (SPC)
§ Panelized board test
§ Fixed stationary probes
§ Advanced Fiducial Recognition system
§ Barcode reader system
§ Board Marking System
§ SMEMA compatible operation
§ Best value and quick return on investment
System Highlights
§ Advanced Architecture
§ Boundary Scan
§ Advanced Function Test
§ Program Development
§ Software Environment
§ SpeedPlus
§ Motion Optimizer
§ Open Pin Detect
§ StatManager SPC?
Advanced Machine Architecture
Surface linear motor systems with freedom of movement in X and Y directions provide the most advanced architecture for flying probe testers. Sprint’s mono-planar head arrangement allows four identical probes to contact target boards with high precision and at an optimal probing angle. Precise surface linear motors independently move the four, equal-length, equal angle probes on the same plane over the unit-under-test (UUT). A precisely controlled air gap separates motors from platens, thus providing true wear-free operation. Similar to stepper motors, linear platen motors require no feedback and operate with precision. All probes have equal geographic accessibility to the board. Better fault coverage is obtained through increased flexibility in probe usage.
An automatically adjusting printed circuit board conveyor securely aligns and clamps boards in place. A fiducial camera confirms and automatically adjusts head motion for board alignment errors.
Boundary Scan
Boundary Scan test (JTAG) is a test methodology based on IEEE 1149.1 standard. Compliant Semiconductors, when installed on a circuit board, allow the interconnecting nets and digital clusters such as memory devices to be tested using a simple external physical set-up. Boundary Scan (JTAG) also offers a comprehensive board-level protocol for programming flash and other programmable devices.
Integration of boundary scan test into the flying probe environment translates into important advantages;
§ Dramatic increase in test coverage by combined use of flying probe and boundary scan resources
§ More efficient shorts test using flying probes and higher throughput
§ Reusable Boundary Scan test patterns
Boundary Scan Features on Sprint 4510
§ Standard dual Boundary Scan ports
§ Factory integrated high-speed boundary scan controller with fully programmable TCK and drive levels
§ Standard Digital I/O lines
§ Optional additional boundary scan controlled digital I/Os
§ Boundary scan infra-structure test
§ Interconnect test, digital and analog cluster test, memory test
§ Flash and in-system device programming (ISP)
§ Intelligent graphical diagnostics
Advanced Function Test
Advanced Function Test expands the capabilities of the Sprint 4510 beyond basic manufacturing process test. External commercially available instruments integrate directly with the Sprint 4510 and signal lines are routed to fixed or flying probes through software control. Each instrument’s graphical user interface (GUI) provides an intuitive representation of the instrument controls and functions. Configuring instruments for a measurement is as simple as setting the dials. Once the parameters for a particular measurement are configured, program steps within the Sprint 4510 environment flow seamlessly. Instrument drivers are based on Interchangeable Virtual Instrument (IVI) protocols thus allowing easy and fast instrument replacement. AFTS Features:
§ Dual Instrument Rack – 19 inch
§ Support for PCI, PXI, GPIB and USB2.0 programmable instruments
§ Precision low noise auto-ranging modular power supplies
§ Standard support for up to 4 user power supplies, expandable as required
§ Voltage ranges of 5V to 60V and current ranges of 1A to 20A per power supply
§ Series/parallel wiring of power supplies provides up-to 240V or 80A
§ 25 different power supply modules to choose from
§ Quick replacement of power supply units
§ Full programmability from power supply GUI or Sprint 4510 software environment
§ Digital Storage Scope – 100 MHz, 1 GS/s, programmable from Sprint 4510 GUI and instrument front panel
§ Arbitrary Waveform Generator – 20 MHZ, programmable from Sprint 4510 GUI and instrument front panel
§ Vision controlled fixed probe placement
§ Power-on mixed signal testing
§ IVI drivers and technical support for user selected instruments
